Undergraduate

Credit Structure: (1-4)3

Catalog Description :

Introduction. Fundamentals of crystallography. Properties of X-rays and electron beam. Use of X-ray diffraction (XRD) to determine crystal structures, chemical compositions of metallic and ceramic materials. Scanning electron microscope, its principles of operation.  Metallographic sample preparation: cutting, grinding, polishing, etching. Optical microscopy. Reflected light and transmitted light microscopy.

Course Objectives :

The course is designed to give the students the necessary background for materials characterization. Upon completion of this class, the student is expected to understand the use of the following analytical equipments: XRD, SEM, optical microscope. The type of materials examined with these equipments may range from polymers to metals and ceramics.

Prerequisites :

None

Textbook(s) :

Lecture notes comprising materials from references.

References :

• B.D. Cullity, “Elements of X-Ray Diffraction”, Second Edition, Addison-Wesley, Reading, 1978

• W.E. Lee and W.M. Rainforth, “Ceramic Microstructures: property control by processing”, Chapman & Hall, London, 1994.

• ASM Handbook, Vol:9, “Metallography and Microstructures”, ASM, The Materials Information Society.

Syllabus :

1.      Introduction (1 week)

2.      Geometry of crystals and properties of x-rays (1 week)

3.      Crystal structure determination (2 weeks that includes 8 hours lab work)

4.      Internal reference method for chemical analysis (1 week that includes 4 hours lab work)

5.      Operation principles of scanning electron microscopes (SEM) (1 week that includes 4 hours lab work)

6.      Use of SEM for surface topography analysis in secondary electron image mode (1 week that includes 4 hours lab work)

7.      Use of SEM for chemical and phase distribution analysis ( 1 week that includes 4 hours lab work)

8.      Reflected light microscopy (4 weeks that includes 16 hours lab work)

9.      Transmitted light microscopy (1 week that includes a lab trip)

Homeworks, Quizzes, Projects:

There will be a lab-report end of every lab session. A term project should be done on selected materials that will be assigned to each student at the beginning of the semester.

Computer Usage:

XRD diffracted angle calculations will be done using a spreadsheet program. An image analysis software will be used for phase analysis of optical microscope images.

Laboratory Work:

The following lab work will be performed by students in groups of four. At the end of each lab a lab-report will be type-written to be turned in at the beginning of the next lab period. 

Lab 1. Crystal structure determination (2 weeks that includes 8 hours lab work)

Lab 2. Internal reference method for chemical analysis (1 week that includes 4 hours lab work)

Lab 3. Operation principles of scanning electron microscopes (SEM) (1 week that includes 4 hours lab work)

Lab 4. Use of SEM for surface topography analysis in secondary electron image mode (1 week that includes 4 hours lab work)

Lab 5. Use of SEM for chemical and phase distribution analysis ( 1 week that includes 4 hours lab work)

Lab 6. Introduction to reflected light microscopy (1 week that includes 4 hours lab work)

Lab 7. Metallographic sample preparation ( 8 hours lab work)

Lab 8. Reflected light microscopy ( 8 hours lab work) 

Lab 9. Transmitted light microscopy (1 week that includes a lab trip)

Coordinator:

Asst.Prof.Dr. Sedat Akkurt

Faculty of Engineering, İzmir Institute of Technology, Urla 35430 IZMIR TURKEY

phone +90-232-750-7800   fax +90-232-750-7890